Ming-Dou Ker, Kun-Hsien Lin. The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs. J. Solid-State Circuits, 40(8):1751-1759, 2005. [doi]
@article{KerL05,
title = {The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs},
author = {Ming-Dou Ker and Kun-Hsien Lin},
year = {2005},
doi = {10.1109/JSSC.2005.852046},
url = {https://doi.org/10.1109/JSSC.2005.852046},
researchr = {https://researchr.org/publication/KerL05},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {40},
number = {8},
pages = {1751-1759},
}