The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs - researchr publication

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Ming-Dou Ker, Kun-Hsien Lin. The impact of low-holding-voltage issue in high-voltage CMOS technology and the design of latchup-free power-rail ESD clamp circuit for LCD driver ICs. J. Solid-State Circuits, 40(8):1751-1759, 2005. [doi]

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