ESD protection design for I/O cells with embedded SCR structure as power-rail ESD clamp device in nanoscale CMOS technology

Ming-Dou Ker, Kun-Hsien Lin. ESD protection design for I/O cells with embedded SCR structure as power-rail ESD clamp device in nanoscale CMOS technology. J. Solid-State Circuits, 40(11):2329-2338, 2005. [doi]

Abstract

Abstract is missing.