2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue

Ming-Dou Ker, Tzu-Ming Wang, Hung-Tai Liao. 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 820-823, IEEE, 2008. [doi]

Authors

Ming-Dou Ker

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Tzu-Ming Wang

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Hung-Tai Liao

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