Ming-Dou Ker, Tzu-Ming Wang, Hung-Tai Liao. 2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue. In International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA. pages 820-823, IEEE, 2008. [doi]
@inproceedings{KerWL08,
title = {2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue},
author = {Ming-Dou Ker and Tzu-Ming Wang and Hung-Tai Liao},
year = {2008},
doi = {10.1109/ISCAS.2008.4541544},
url = {http://dx.doi.org/10.1109/ISCAS.2008.4541544},
tags = {reliability},
researchr = {https://researchr.org/publication/KerWL08},
cites = {0},
citedby = {0},
pages = {820-823},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2008), 18-21 May 2008, Sheraton Seattle Hotel, Seattle, Washington, USA},
publisher = {IEEE},
}