Hans G. Kerkhoff, Mustafa Acar. Testable Design and Testing of Micro-Electro-Fluidic Arrays. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 403-409, IEEE Computer Society, 2003. [doi]
@inproceedings{KerkhoffA03,
title = {Testable Design and Testing of Micro-Electro-Fluidic Arrays},
author = {Hans G. Kerkhoff and Mustafa Acar},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240403abs.htm},
tags = {testing, design},
researchr = {https://researchr.org/publication/KerkhoffA03},
cites = {0},
citedby = {0},
pages = {403-409},
booktitle = {21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1924-5},
}