Brian R. Kessler, Jeffrey Dreibelbis, Tim McMahon, Joshua S. McCloy, Rex Kho. BIST-Based Bitfail Mapping of an Embedded DRAM. In 9th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2001), 6-7 August 2001, San Jose, CA, USA. pages 29, IEEE Computer Society, 2001. [doi]
Abstract is missing.