Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models - researchr publication authors

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Johannes Keustermans, Wouter Mollemans, Dirk Vandermeulen, Paul Suetens. Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 2464-2467, IEEE, 2010. [doi]

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