Johannes Keustermans, Wouter Mollemans, Dirk Vandermeulen, Paul Suetens. Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 2464-2467, IEEE, 2010. [doi]
@inproceedings{KeustermansMVS10,
title = {Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models},
author = {Johannes Keustermans and Wouter Mollemans and Dirk Vandermeulen and Paul Suetens},
year = {2010},
doi = {10.1109/ICPR.2010.603},
url = {http://dx.doi.org/10.1109/ICPR.2010.603},
researchr = {https://researchr.org/publication/KeustermansMVS10},
cites = {0},
citedby = {0},
pages = {2464-2467},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}