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Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models

Johannes Keustermans, Wouter Mollemans, Dirk Vandermeulen, Paul Suetens. Automated Cephalometric Landmark Identification Using Shape and Local Appearance Models. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 2464-2467, IEEE, 2010. [doi]

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