Mohammad Athar Khalil, Chin-Long Wey. High-Voltage Stress Test Paradigms of Analog CMOS ICs for Gate-Oxide Reliability Enhancement. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 333-338, IEEE Computer Society, 2001. [doi]
Abstract is missing.