Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM

Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh. Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM. IEEE Trans. VLSI Syst., 26(8):1508-1517, 2018. [doi]

Authors

Mohammad Nasim Imtiaz Khan

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Anirudh Iyengar

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Swaroop Ghosh

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