Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM

Mohammad Nasim Imtiaz Khan, Anirudh Iyengar, Swaroop Ghosh. Novel Magnetic Burn-In for Retention and Magnetic Tolerance Testing of STTRAM. IEEE Trans. VLSI Syst., 26(8):1508-1517, 2018. [doi]

Abstract

Abstract is missing.