Rafid Adnan Khan, Mohammad Muhtady Muhaisin, Gordon W. Roberts. An In-Situ Technique for Measuring the Individual Contact Resistance between the Pins of an IC Package and the Board of a Flexible Hybrid Electronic System. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.