Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity - researchr publication authors

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Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor. Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. In 8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013. pages 1-6, IEEE, 2013. [doi]

This author has not been identified. Look up 'Seyab Khan' in GoogleThis author has not been identified. Look up 'Mottaqiallah Taouil' in GoogleThis author has not been identified. Look up 'Said Hamdioui' in GoogleThis author has not been identified. Look up 'Halil Kukner' in GoogleThis author has not been identified. Look up 'Praveen Raghavan' in GoogleThis author has not been identified. It may be one of the following persons:

Francky Catthoor

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