Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity - researchr publication related

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Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor. Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. In 8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013. pages 1-6, IEEE, 2013. [doi]

The following publications are possibly variants of this publication:

Bias temperature instability analysis in SRAM decoderSeyab Khan, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor. ets 2013: 1 [doi]

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