Seyab Khan, Mottaqiallah Taouil, Said Hamdioui, Halil Kukner, Praveen Raghavan, Francky Catthoor. Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity. In 8th International Design and Test Symposium, IDT 2013, Marrakesh, Morocco, 16-18 December, 2013. pages 1-6, IEEE, 2013. [doi]
Abstract is missing.