Saqib A. Khan, Shi-Jie Wen, Sanghyeon Baeg. Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation. IEICE Electronic Express, 13(17):20160627, 2016. [doi]
@article{KhanWB16,
title = {Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation},
author = {Saqib A. Khan and Shi-Jie Wen and Sanghyeon Baeg},
year = {2016},
doi = {10.1587/elex.13.20160627},
url = {http://dx.doi.org/10.1587/elex.13.20160627},
researchr = {https://researchr.org/publication/KhanWB16},
cites = {0},
citedby = {0},
journal = {IEICE Electronic Express},
volume = {13},
number = {17},
pages = {20160627},
}