Variability and reliability aware surrogate model for sensing delay analysis of SRAM sense amplifier - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Sapna Khandelwal, Jyoti Meena, Lokesh Garg, Dharmendar Boolchandani. Variability and reliability aware surrogate model for sensing delay analysis of SRAM sense amplifier. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-6, IEEE, 2016. [doi]

This author has not been identified. Look up 'Sapna Khandelwal' in GoogleThis author has not been identified. Look up 'Jyoti Meena' in GoogleThis author has not been identified. Look up 'Lokesh Garg' in GoogleThis author has not been identified. Look up 'Dharmendar Boolchandani' in Google

runs on WebDSL