Sapna Khandelwal, Jyoti Meena, Lokesh Garg, Dharmendar Boolchandani. Variability and reliability aware surrogate model for sensing delay analysis of SRAM sense amplifier. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.