M. Kharbouche-Harrari, Jérémy Postel-Pellerin, Gregory di Pendina, Romain Wacquez, D. Aboulkassimi, Marc Bocquet, R. Sousa, R. Delattre, Jean Michel Portal. Impact of a Laser Pulse on a STT-MRAM Bitcell: Security and Reliability Issues. In Dimitris Gizopoulos, Dan Alexandrescu, Mihalis Maniatakos, Panagiota Papavramidou, editors, 24th IEEE International Symposium on On-Line Testing And Robust System Design, IOLTS 2018, Platja D'Aro, Spain, July 2-4, 2018. pages 243-244, IEEE, 2018. [doi]
Abstract is missing.