Methodology for fault grading high speed I/O interfaces used in complex Graphics Processing Unit

A. Khare, P. Kishore, S. Reddy, K. Rajan, A. Sanghani. Methodology for fault grading high speed I/O interfaces used in complex Graphics Processing Unit. In 2012 IEEE International Test Conference, ITC 2012, Anaheim, CA, USA, November 5-8, 2012. pages 1-8, IEEE Computer Society, 2012. [doi]

Abstract

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