Jitendra Khare, Amit B. Shah, Ashok Raman, Girish Rayas. Embedded Memory Field Returns - Trials and Tribulations. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-6, IEEE, 2006. [doi]
Abstract is missing.