Determination of the stress level for voltage screen of integrated circuits - researchr publication authors

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R. M. Kho, A. J. Moonen, V. M. Girault, Jaap Bisschop, E. H. T. Olthof, S. Nath, Z. N. Liang. Determination of the stress level for voltage screen of integrated circuits. Microelectronics Reliability, 50(9-11):1210-1214, 2010. [doi]

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