R. M. Kho, A. J. Moonen, V. M. Girault, Jaap Bisschop, E. H. T. Olthof, S. Nath, Z. N. Liang. Determination of the stress level for voltage screen of integrated circuits. Microelectronics Reliability, 50(9-11):1210-1214, 2010. [doi]
@article{KhoMGBONL10,
title = {Determination of the stress level for voltage screen of integrated circuits},
author = {R. M. Kho and A. J. Moonen and V. M. Girault and Jaap Bisschop and E. H. T. Olthof and S. Nath and Z. N. Liang},
year = {2010},
doi = {10.1016/j.microrel.2010.07.103},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.103},
researchr = {https://researchr.org/publication/KhoMGBONL10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1210-1214},
}