Ajay Khoche, Domenico Chindamo, Michael Braun, Martin Fischer. Selective and Accurate Fail Data Capture in Compression Environment for Volume Diagnostics. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-10, IEEE, 2006. [doi]
Abstract is missing.