Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra. Test Vector Compression Using EDA-ATE Synergies. In 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It s a Gamble, 28 April - 2 May 2002, Monterey, CA, USA. pages 97-102, IEEE Computer Society, 2002. [doi]
Abstract is missing.