Saman Kiamehr, Thomas H. Osiecki, Mehdi Baradaran Tahoori, Sani Nassif. Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]
Abstract is missing.