Deterministic BIST with partial scan

Gundolf Kiefer, Hans-Joachim Wunderlich. Deterministic BIST with partial scan. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 110-116, IEEE Computer Society, 1999. [doi]

Authors

Gundolf Kiefer

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Hans-Joachim Wunderlich

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