Gundolf Kiefer, Hans-Joachim Wunderlich. Deterministic BIST with partial scan. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 110-116, IEEE Computer Society, 1999. [doi]
@inproceedings{KieferW99-0,
title = {Deterministic BIST with partial scan},
author = {Gundolf Kiefer and Hans-Joachim Wunderlich},
year = {1999},
doi = {10.1109/ETW.1999.804415},
url = {https://doi.org/10.1109/ETW.1999.804415},
researchr = {https://researchr.org/publication/KieferW99-0},
cites = {0},
citedby = {0},
pages = {110-116},
booktitle = {4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999},
publisher = {IEEE Computer Society},
isbn = {0-7695-0390-X},
}