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Gundolf Kiefer, Hans-Joachim Wunderlich. Deterministic BIST with partial scan. In 4th European Test Workshop, ETW 1999, Constance, Germany, May 25-28, 1999. pages 110-116, IEEE Computer Society, 1999. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Deterministic BIST with Partial ScanGundolf Kiefer, Hans-Joachim Wunderlich. et, 16(3):169-177, 2000. [doi] Deterministic BIST with multiple scan chainsGundolf Kiefer, Hans-Joachim Wunderlich. itc 1998: 1057-1064 [doi] Deterministic BIST with Multiple Scan ChainsGundolf Kiefer, Hans-Joachim Wunderlich. et, 14(1-2):85-93, 1999. [doi]
The following publications are possibly variants of this publication: