Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy

Jin Seob Kim, Bijan Afsari, Gregory S. Chirikjian. Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy. Journal of Computational Biology, 24(1):13-30, 2017. [doi]

@article{KimAC17,
  title = {Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy},
  author = {Jin Seob Kim and Bijan Afsari and Gregory S. Chirikjian},
  year = {2017},
  doi = {10.1089/cmb.2016.0139},
  url = {http://dx.doi.org/10.1089/cmb.2016.0139},
  researchr = {https://researchr.org/publication/KimAC17},
  cites = {0},
  citedby = {0},
  journal = {Journal of Computational Biology},
  volume = {24},
  number = {1},
  pages = {13-30},
}