Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy

Jin Seob Kim, Bijan Afsari, Gregory S. Chirikjian. Cross-Validation of Data Compatibility Between Small Angle X-ray Scattering and Cryo-Electron Microscopy. Journal of Computational Biology, 24(1):13-30, 2017. [doi]

Abstract

Abstract is missing.