Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Saluja. Multiple Faults: Modeling, Simulation and Test. In Proceedings of the ASPDAC 2002 / VLSI Design 2002, CD-ROM, 7-11 January 2002, Bangalore, India. pages 592-597, IEEE Computer Society, 2002. [doi]
Abstract is missing.