Daeyeon Kim, Vikas Chandra, Robert C. Aitken, David Blaauw, Dennis Sylvester. Variation-aware static and dynamic writability analysis for voltage-scaled bit-interleaved 8-T SRAMs. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 145-150, ACM, 2011. [doi]
Abstract is missing.