Low-cost diagnosis of defects in MCM substrate interconnections - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan. Low-cost diagnosis of defects in MCM substrate interconnections. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 260-265, IEEE Computer Society, 1996. [doi]

This author has not been identified. Look up 'Bruce C. Kim' in GoogleThis author has not been identified. Look up 'Abhijit Chatterjee' in GoogleThis author has not been identified. Look up 'Madhavan Swaminathan' in Google

runs on WebDSL