Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan. Low-cost diagnosis of defects in MCM substrate interconnections. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 260-265, IEEE Computer Society, 1996. [doi]
@inproceedings{KimCS96,
title = {Low-cost diagnosis of defects in MCM substrate interconnections},
author = {Bruce C. Kim and Abhijit Chatterjee and Madhavan Swaminathan},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040260abs.htm},
tags = {C++},
researchr = {https://researchr.org/publication/KimCS96},
cites = {0},
citedby = {0},
pages = {260-265},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}