A Novel Low-Cost Approach to MCM Interconnect Test - researchr publication authors

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Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel. A Novel Low-Cost Approach to MCM Interconnect Test. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 184-192, IEEE Computer Society, 1995.

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