Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel. A Novel Low-Cost Approach to MCM Interconnect Test. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 184-192, IEEE Computer Society, 1995.
@inproceedings{KimCSS95,
title = {A Novel Low-Cost Approach to MCM Interconnect Test},
author = {Bruce C. Kim and Abhijit Chatterjee and Madhavan Swaminathan and David E. Schimmel},
year = {1995},
tags = {testing, C++, e-science, systematic-approach},
researchr = {https://researchr.org/publication/KimCSS95},
cites = {0},
citedby = {0},
pages = {184-192},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}