Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents

Wook Kim, Kyung Tae Do, Young-Hwan Kim. Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents. IEEE Trans. VLSI Syst., 18(4):602-615, 2010. [doi]

Authors

Wook Kim

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Kyung Tae Do

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Young-Hwan Kim

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