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Wook Kim, Kyung Tae Do, Young-Hwan Kim. Statistical Leakage Estimation Based on Sequential Addition of Cell Leakage Currents. IEEE Trans. VLSI Syst., 18(4):602-615, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Statistical leakage analysis using the deterministic modeling of cell leakage currentJae-Hoon Kim, Young-Hwan Kim. icecsys 2012: 837-840 [doi] Efficient statistical leakage analysis using deterministic cell leakage modelsJae-Hoon Kim, Young-Hwan Kim. mj, 44(9):764-773, 2013. [doi]
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