Analyzing the Impact of Joint Optimization of Cell Size, Redundancy, and ECC on Low-Voltage SRAM Array Total Area

Nam Sung Kim, Stark C. Draper, Shi-Ting Zhou, Sumeet Katariya, Hamid Reza Ghasemi, Taejoon Park. Analyzing the Impact of Joint Optimization of Cell Size, Redundancy, and ECC on Low-Voltage SRAM Array Total Area. IEEE Trans. VLSI Syst., 20(12):2333-2337, 2012. [doi]

Abstract

Abstract is missing.