Induced norm from L2 to L∞ in SISO sampled-data systems

Jung Hoon Kim, Tomomichi Hagiwara. Induced norm from L2 to L∞ in SISO sampled-data systems. In American Control Conference, ACC 2015, Chicago, IL, USA, July 1-3, 2015. pages 2862-2867, IEEE, 2015. [doi]

Abstract

Abstract is missing.