Learning-based dynamic reliability management for dark silicon processor considering EM effects

Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan. Learning-based dynamic reliability management for dark silicon processor considering EM effects. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 463-468, IEEE, 2016. [doi]

Abstract

Abstract is missing.