Automated di/dt stressmark generation for microprocessor power delivery networks - researchr publication authors

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Youngtaek Kim, Lizy Kurian John. Automated di/dt stressmark generation for microprocessor power delivery networks. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 253-258, ACM, 2011. [doi]

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