Youngtaek Kim, Lizy Kurian John. Automated di/dt stressmark generation for microprocessor power delivery networks. In Vojin G. Oklobdzija, Barry Pangle, Naehyuck Chang, Naresh R. Shanbhag, Chris H. Kim, editors, Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010. pages 253-258, ACM, 2011. [doi]
@inproceedings{KimJ11,
title = {Automated di/dt stressmark generation for microprocessor power delivery networks},
author = {Youngtaek Kim and Lizy Kurian John},
year = {2011},
url = {http://portal.acm.org/citation.cfm?id=2016860&CFID=34981777&CFTOKEN=25607807},
researchr = {https://researchr.org/publication/KimJ11},
cites = {0},
citedby = {0},
pages = {253-258},
booktitle = {Proceedings of the 2010 International Symposium on Low Power Electronics and Design, 2010, Austin, Texas, USA, August 18-20, 2010},
editor = {Vojin G. Oklobdzija and Barry Pangle and Naehyuck Chang and Naresh R. Shanbhag and Chris H. Kim},
publisher = {ACM},
isbn = {978-1-4503-0146-6},
}