Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis

Sunghoon Kim, Seokjun Jang, Sungho Kang. Scan Chain Architecture With Data Duplication for Multiple Scan Cell Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(8):2717-2727, 2023. [doi]

Abstract

Abstract is missing.