Youngtaek Kim, Lizy Kurian John, Sanjay Pant, Srilatha Manne, Michael J. Schulte, William Lloyd Bircher, Madhu Saravana Sibi Govindan. AUDIT: Stress Testing the Automatic Way. In 45th Annual IEEE/ACM International Symposium on Microarchitecture, MICRO 2012, Vancouver, BC, Canada, December 1-5, 2012. pages 212-223, IEEE Computer Society, 2012. [doi]
Abstract is missing.