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Kee Sup Kim, Charles R. Kime. Partial Scan Using Reverse Direction Empirical Testability. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 498-506, IEEE Computer Society, 1993.

The following publications are possibly variants of this publication:

Partial Scan by Use of Empirical TestabilityKee Sup Kim, Charles R. Kime. iccad 1990: 314-317

Partial scan flip-flop selection by use of empirical testabilityKee Sup Kim, Charles R. Kime. et, 7(1-2):47-59, 1995. [doi]

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