Kee Sup Kim, Charles R. Kime. Partial scan flip-flop selection by use of empirical testability. J. Electronic Testing, 7(1-2):47-59, 1995. [doi]
@article{KimK95:1,
title = {Partial scan flip-flop selection by use of empirical testability},
author = {Kee Sup Kim and Charles R. Kime},
year = {1995},
doi = {10.1007/BF00993313},
url = {http://dx.doi.org/10.1007/BF00993313},
tags = {empirical, testing},
researchr = {https://researchr.org/publication/KimK95%3A1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {7},
number = {1-2},
pages = {47-59},
}